Many thanks to all of our speakers for making this a successful conference. To print a program, click SVW schedule update.

Day 1 Speakers

Alain Diebold, Empire Innovation Professor of Nanoscale Science, SUNY Polytechnic, “Importance and Challenges of Metrology for Nanoscale Materials and Semiconductor Structures”

Thomas Kelly, Vice President for Innovation, Cameca Instruments, “Atomic-Scale Tomography”

Wenbing Yun, President and Co-Founder, SIGRAY.com, “Innovating X-ray Techniques to Meet the Structure and Composition Determination in Small Volumes”

Philip Batson, Distinguished Research Professor, Materials Science and Engineering, Rutgers University, “Milli-EV Resolution Electron Energy Loss Spectroscopy in the Electron Microscope”

Guido Schmitz, Professor, Department of Materials Physics, University of Stuttgart, “Atom probe quantification: A struggle towards the perfect tomographic reconstruction”

Masashi Watanabe, Associate Professor, Materials Science & Engineering, Lehigh University, “Toward Quantification of Atomi-Resolution X-ray Analysis in Aberration-corrected STEM”

Douglas Medlin, Materials Scientist, Sandia National Laboratories, “Atomic-scale analyses of interface and defect structures in chalcogenide material”

Jian-Min Zuo, Professor of Materials Science & Engineering, University of Illinois – Urbana-Champaign, “Three-dimensional  atomic structure determination”

Joanne Etheridge, Director, Monash Centre for Electron Microscopy & Professor, Materials Science and Engineering, Monash University, “Interrogating the atoms that matter with convergent electron beams”

Day 1 concludes with poster presentations.

Day 2 Speakers

François Vurpillot, Professor, Department of Materials Physics, University of Rouen, “Metrology at the nanometre scale in Atom Probe Tomography”

Ondrej Krivanek, President and Co-Founder, NION.com, “STEM instrumentation for atomic-resolution imaging and analysis”

Robert Klie, Associate Professor, Nanoscale Physics Group, University of Illinois, “Using graphene liquid cells for high-resolution chemical analysis of nano-particle reactions”

Nigel Browning, Laboratory Fellow, Materials Sciences, Pacific Northwest National Laboratory, “Dynamic Observations by In-situ TEM”

Quentin Ramasse, Scientific Director, SuperSTEM Daresbury Lab, “Imaging and Spectroscopy at the Single Atom Level in the Scanning Transmission Electron Microscope”

David Muller, Professor of Applied & Engineering Physics, and co-director of the Kavli Institute for Nanoscale Science, Cornell University, “Measuring Physical and Electronic Properties at the Nanoscale”

Lorenz Kienle, Director, Institute for Materials Science, University of Kiel, “Discoveries in Small Volumes”

Matt Wormington, Chief Technology Officer, Jordan Valley Semiconductors, “High-Resolution X-ray Diffraction of Epitaxial Thin-Films and Patterned Nanostructures”

Michael Moody, Associate Professor, Department of Materials, Oxford University, “Developing APT for semiconductor and nanoparticle applications”

Day 2 concludes with a panel discussion.

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